Dictionary-Less Defect Diagnosis as Surrogate Single Stuck-At Faults

We propose a low complexity algorithm to diagnose non-classical faults in combinational circuits using classic single stuck-at faults as surrogates. The algorithm is based on effectcause analysis and uses information from both passing and failing patterns as well as knowledge about the outputs where error is detected or not detected. A set of candidate single stuck-at faults is identified after performing minimal fault simulations. Considering that a real defect is hardly ever a single stuck-at fault, the diagnosed set is called “the surrogate”. The proposed procedure was evaluated by experiments on ISCAS85 benchmark circuits and its effectiveness is demonstrated.